Integrated Micro-Electronics, Inc. (IMI), China (Jiaxing) Test and Systems Development (TSD) team recently received five National Invention Patent awards from the China National Intellectual Property Administration (CNIPA or 国家知识产权局).
The following patents were implemented in highly automated test systems for the manufacture and testing of advanced automotive electronic devices and electric vehicle (EV) sub-assemblies:
- Rapid test equipment for powertrain module/ECU of an EV
- Rapid Electronic Steering engine control unit test equipment
- Automatic Intelligent loading and unloading carousel for electronic testing (Hall Sensors)
- High Capacity batch aging (burn-in) equipment for ambient light panels (car LED Strip; and
- Rotating Platform Test Architecture Based on LabVIEW (a standard test programming language)
- IMI China patents
- CNIPA is the patent and trademark office and primary intellectual property regulator of China.
Congratulations to the employee-inventors: Feng Wan, Chun-yang Li, Xue Jiang, Qui-lin Deng, and Yue-pei Gao who have been developing innovative test solutions that are shipped and used in other IMI factories.