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iNEMI Packaging Tech Topic Series: Damage-Free Rapid Electron Beam Testing for Advanced Packaging

07/24/2024 | iNEMI
Testing issues are limiting chip makers’ ability to create larger SOCs (system-on-chip). The scan field dimensions of EUV (extreme ultraviolet light) and NA (numerical aperture) EUV, which are typically used for testing, are too small.

iNEMI Packaging Tech Topic Series: Damage-Free Rapid Electron Beam Testing for Advanced Packaging

07/16/2024 | iNEMI
Testing issues are limiting chip makers’ ability to create larger SOCs (system-on-chip). The scan field dimensions of EUV (extreme ultraviolet light) and NA (numerical aperture) EUV, which are typically used for testing, are too small. To enable larger chips, manufacturers are migrating to system-on-a-package (SOP).

Lockheed Martin Announces Industrial Participation, Offset Opportunities For Thailand

07/16/2024 | Lockheed Martin
Lockheed Martin announced it would continue its legacy of delivering economic value to Thailand through a robust industrial participation proposal – also known as an “offset” proposal – driven by the Thai government’s evaluation of the F-16 Block 70/72 for its future fighter program.

RS-25 Engines are Ready for Artemis IV

07/09/2024 | L3Harris Technologies
Aerojet Rocketdyne, an L3Harris Technologies company, has completed modernizing the four flight-proven RS-25 engines that will help power NASA’s Space Launch System (SLS) rocket on the Artemis IV mission.

Real Time with… IPC APEX EXPO 2024: Sigma Engineering's Recycling and Regeneration Systems for PCB Etching

05/02/2024 | Real Time with...IPC APEX EXPO
Evan Howard of Schmoll America interviews Kristoffer Bjorklund, Sigma Engineering's supply chain manager. We learn about Sigma's recycling and regeneration systems for PCB industry etching and the benefits and challenges of implementing these systems in existing factories.
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