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StratEdge Semiconductor Packages Set to Take the Spotlight at European Microwave Week and IMAPS Symposium

09/11/2024 | StratEdge
StratEdge Corporation announces that it will be exhibiting in booth 923B at European Microwave Week (EuMW), being held at Porte de Versailles Paris, France from September 24-27, and booth 313 at IMAPS International Symposium for Microelectronics being held at the Encore Boston Harbor in Everett, Massachusetts, on October 1-2.

Reliability Comparisons of FPBGA Assemblies Under Hot/Cold Biased Thermal Cycle

08/06/2024 | Thomas Sanders, Seth Gordon, Reza Ghaffarian, Jet Propulsion Laboratory
Current trends in microelectronic packaging technologies continue in the direction of smaller, lighter, and higher density packages. The telecommunications industry and particularly mobile/portable devices have a strong need for lighter and smaller products. The current emerging advanced packaging (AP) technologies, including system-in-package (SiP) and 2.5D/3D stacked packaging, added another level of complexity and challenges for implementation.

SMTA Oregon Event Spreads Its Wings

06/25/2024 | Nolan Johnson, I-Connect007
Hillsboro, Oregon is home to the largest Intel campus in the United States as the base of operations for most of Intel’s CPU development. Hillsboro boasts experts and teams in IC and PCB physical layout, packaging, and R&D. Intel and satellite companies in its orbit deliver PCB fabrication and PCB assembly as well. So it's no surprise that SMTA Oregon’s annual meeting takes place practically in the shadows of Intel’s Hillsboro campus.

TopLine Introduces Braided Columns as Drop-in Replacement for BGA Solder Balls

06/17/2024 | TopLine

Würth Elektronik Expands its Range of Power Inductors

05/29/2024 | Wurth Electronics
In addition to Würth Elektronik’s five existing package sizes of WE-XHMI SMT power inductors there are now eight new packages. These compact yet extremely efficient inductors feature high current capacity up to 56 A saturation current and the ability to handle high transient current spikes.
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