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Traditional electroless copper and electroless copper immersion gold have been primary PCB plating methods for decades. But alternative plating metals and processes have been introduced over the past few years as miniaturization and advanced packaging continue to develop.
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TRI’s SEMI and SMT Inspection Solutions at NEPCON Japan 2025
November 15, 2024 | TRIEstimated reading time: Less than a minute
Test Research, Inc. (TRI), the leading Test and Inspection systems provider for the electronics manufacturing industry, will join NEPCON Japan 2025, held at Tokyo Big Sight from January 22 – 24, 2025. Visit booth #E15-40 to experience the latest test and inspection innovations for the SMT and Advanced Packaging / Semiconductor Manufacturing industry.
TRI will showcase the latest back-end inspection solutions, TR7007Q SII-S and TR7700Q SII-S. The TR7007Q SII-S can inspect Mini-LED, C4 bumps (~100 μm Ø), and 008004 paste inspection applications. The AI-powered 3D SEMI AOI, TR7700Q SII-S, can inspect die, wire diameters of up to 15 μm (0.6 mil), SiP, underfill, bumps, and more.
Also presenting at NEPCON Japan will be the High-Speed Multi-Camera 3D AOI, TR7500QE Plus, the world-class High-Speed 3D CT AXI TR7600 SIII for multiple industry applications and the modular board tester, TR5001E SII.
Join us at NEPCON Japan 2025 booth #E15-40 to discover why the leading EMS companies choose TRI as their Test and Inspection Partner.
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