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TRI's AI-Powered Inspection Solutions at SMTAI 2025
September 2, 2025 | TRIEstimated reading time: Less than a minute

Test Research, Inc. (TRI), the leading provider of test and inspection systems, will be joining the SMTA International Exposition & Conference. The event will be held from October 21 – 23, 2025, at the Donald E. Stephens Convention Center in Rosemont, IL, USA.
Visit TRI at booth No. 2740 to explore how TRI's One Stop Solution for electronics manufacturing Testing (ICT and MDA) and Inspection (SPI, AOI, and AXI) can boost your production yield. The SMTAI 2025 lineup includes the multi-camera 3D AOI TR7500QE Plus, the enhanced 3D SPI TR7007Q SII, and an Automated 3D X-Ray Inspection solution demo.
TRI's AI-powered solutions leverage advanced algorithms to improve inspection accuracy and efficiency significantly. The AI-driven defect detection achieves over 99% accuracy for common components, drastically reducing false calls and improving the first pass yield for X-ray and optical character verification. Furthermore, TRI's AI Smart Programming reduces setup time by up to 85%, allowing for faster and more efficient production line operations.
TRI solutions support the current Smart Factory Standards, including the IPC-CFX, IPC-DPMX, and The Hermes Standard (IPC-HERMES-9852).
Discover why the largest EMS businesses chose TRI as their Test and Inspection Partner at booth No. 2740.
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20 Years of Center Nanoelectronic Technologies (CNT) – Backbone of German Semiconductor Research Celebrates Anniversary
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