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Koh Young Discussing Ways to Apply Smart Factory Insights to Maximizing Productivity at SMTA Tijuana
October 14, 2025 | Koh YoungEstimated reading time: 1 minute
Koh Young, the industry leader in True 3D measurement-based inspection solutions, will present at the SMTA Tijuana Expo & Tech Forum on November 13, 2025, at the Quartz Hotel in Tijuana, Baja California.
Héctor Hernández, Regional Sales Manager for Koh Young America, will deliver a technical session titled “The Power of Data: Maximize Productivity with Smart Factory Insights.” Based in Guadalajara, Héctor oversees Koh Young’s operations across Baja, Sonora, Durango, Chihuahua, and Jalisco. With more than a decade of experience helping electronics manufacturers enhance process capability and product quality, he brings a practical understanding of how inspection data and analytics can transform production efficiency.
His presentation explores how manufacturers can harness data to improve productivity, traceability, and quality across the SMT line. The session outlines a stepwise approach to turning raw inspection data into actionable insight. Starting with accurate 3D measurement and inspection results, Héctor will explain how to extract and interpret key metrics such as First Pass Yield (FPY), Defects Per Million Opportunities (DPMO), and Process Capability Index (CPK). He will then demonstrate how AI-driven platforms like KSMART and KPO (Koh Young Process Optimizer) use these metrics to automate programming, perform design of experiments (DOE), and optimize both printing and placement processes.
“When data is captured correctly and used intelligently, it becomes a powerful tool for driving improvement,” said Héctor Hernández. “By connecting inspection and process optimization, manufacturers can reduce variation, improve yields, and make better decisions in real time. That’s what smart factory transformation is really about.”
The presentation will also highlight how Smart Review, Koh Young’s AI-powered analysis tool, minimizes false calls and improves defect classification by learning from historical data and user judgments. Attendees will leave the session with clear strategies to:
- Enable closed-loop optimization across printing, placement, and inspection
- Implement AI-assisted decision-making to reduce human error
- Establish connectivity through IPC-CFX and SECS/GEM standards
- Drive continuous improvement in real time across SMT operations
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