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GOEPEL Test Strategy for IoT Devices Honored at Embedded World 2016
March 7, 2016 | GOEPEL ElectronicEstimated reading time: 1 minute
GOEPEL electronics was awarded by an international jury of experts at the Embedded World 2016 exhibition in Nuremberg for JEDOS (JTAG Embedded Diagnostics OS), GOEPEL's test and diagnostics tool for electronic assemblies. The prestigious Embedded Award is a prize for the embedded community and is awarded to the most innovative companies.
"We are proud of the high recognition our test and diagnostic tool, JEDOS, enjoys. Winning this award shows us that with our technology we're on the right track," said CEO Thomas Wenzel, who received the prize on behalf of the JTAG/Boundary Scan division of GOEPEL electronic. "Moreover, it underlines the constantly increasing relevance of the Internet of Things and the importance of high-performance quality tests of IoT components. By integrating the two platforms, Embedded Diagnostics Test and JTAG/Boundary Scan, we succeeded a major step towards a sustainable test coverage for components of the IoT."
JEDOS is a technology for embedded test of complex electronic design and was first introduced in 2015. Using the native processor, diagnostic functional tests can be performed in real time. Furthermore, JEDOS offers a number of different functions for testing, validation and calibration and for programming. The advantages of JEDOS lie primarily in the possibility to fully test IoT components without the use of firmware. Hence, pre-verified prototype hardware is available and fault isolation is much more efficient.
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