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Joel Scutchfield, Koh Young, to Discuss Journey to Realize AI at SMTA Ontario Conference

09/25/2023 | Koh Young
Koh Young Technology, the leader in True3D™ measurement-based inspection solutions, will discuss the increasingly significant role of data collection and analysis to enable Generative Artificial Intelligence (GenAI) functionality to improve productivity in our industry.

The Chemical Connection: Don’t Just Blame the Etcher

09/25/2023 | Don Ball -- Column: The Chemical Connection
If your HDI or UHDI production process is quality challenged, don’t assume your etcher is to blame. Many factors impact the quality of the final product, so assess broadly, and you may find that the “the devil is in the details.” Generally, the first place most people can get good product specification measurement is at the end of the etching process, It’s natural and easy to blame quality shortcomings on the etcher. By all means, look at your etcher and invest some time trying to improve its performance but don’t stop there. Other factors may be affecting the etch uniformity.

KIC Revolutionizes Electronics Manufacturing with Innovative Solutions for Soldering and Curing Processes

09/21/2023 | KIC
KIC, a renowned pioneer in thermal process and temperature measurement solutions for electronics manufacturing, is thrilled to announce its participation in the upcoming SMTA Guadalajara Expo & Tech Forum.

Scienscope to Display Cutting-Edge Inspection & Material Management at SMTA Guadalajara

09/21/2023 | Scienscope International
Join Scienscope at the Guadalajara Expo and Tech Forum, where innovation knows no bounds. 

Cadence Advances Hyperscale SoC Design with Expanded IP Portfolio for TSMC N3E Process

09/21/2023 | Cadence Design Systems, Inc.
Cadence Design Systems, Inc. announced it has expanded its design IP portfolio on TSMC’s 3nm (N3E) process—most notably with the addition of the flagship Cadence® 224G Long-Reach (224G-LR) SerDes PHY IP, which has achieved first-pass silicon success.
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