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Real Time with… IPC APEX EXPO 2024: Circuit Board Testing Strategies and the Impact of AI with Bert Horner
May 8, 2024 |Estimated reading time: 1 minute
Editor Marcy LaRont speaks with Bert Horner, president of The Test Connection, about the importance of strategic planning and design-for-test (DFT). Bert touches on some common mistakes that occur when DFT is not adequately considered early on. The discussion outlines an overarching industry need for a culture shift toward increasingly higher levels of integration and collaboration. Bert mentions that AI now has an influence on testing, as everywhere else, and announces his forthcoming book.
Click to watch the interview on our Real Time with... IPC APEX EXPO 2024 event site.
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