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RTW IPC APEX EXPO: Mirtec Discusses Latest Developments in Inspection Technologies
March 8, 2017 | Real Time with...IPCEstimated reading time: Less than a minute
Mirtec President Brian D'Amico brings I-Connect Technical Editor Pete Starkey up to speed with the latest developments in 2D and 3D AOI and SPI inspection technologies. He also talks about the sales success of the MV-6 OMNI series in-line full-3D AOI machine, with advanced features such as 15-megapixel top-down camera and 3D digital multi-frequency Moire, but attractively priced to appeal to the small-to-medium scale user.
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