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Most designers favor manual routing, but today's interactive autorouters may be changing designers' minds by allowing users more direct control. In this issue, our expert contributors discuss a variety of manual and autorouting strategies.
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Why is it so difficult to create the ideal data package? Many of these simple errors can be alleviated by paying attention to detail—and knowing what issues to look out for. So, this month, our experts weigh in on the best practices for creating the ideal design data package for your design.
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Our experts discuss the constantly evolving world of RF design, including the many tradeoffs, material considerations, and design tips and techniques that designers and design engineers need to know to succeed in this high-frequency realm.
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Keysight Webinar May 6: Get Ready for Gen5 With PCIe and DDR
April 23, 2020 | Keysight TechnologiesEstimated reading time: Less than a minute
This Keysight seminar will be held May 6, 2020. Presenters will cover test and validation methodologies, with best-practice examples, to help PCIe 5.0 and DDR5 technology adopters fully test all key measurement parameters to ensure their design meets the specification requirements.
Attendees will learn the following:
- Evolution of PCIe and DDR technologies
- PHY Layer testing challenges at 32 GHz NRZ and 64 GT/s
- Looking forward to PAM4 technologies
- TX and RX test solutions for PCIe 5.0 and DDR5 Devices
- Simulation and verification environments
- New requirements for DDR5 simulation
AGENDA
- 10:00 am PT / 1:00 pm ET
Leading Edge + Mainstream Technologies: Everything is Moving to Next Generation - 10:30 am PT / 1:30 pm ET
Master PCIe Transmitter and Receiver Measurement Techniques - 11:45 am PT / 2:45 pm ET
Latest DDR5 Developments – Planning for DDR6
For a more detailed agenda, please click here.
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Magnalytix and Foresite to Host Technical Webinar on SIR Testing and Functional Reliability
06/26/2025 | MAGNALYTIXMagnalytix, in collaboration with Foresite Inc., is pleased to announce an upcoming one-hour Webinar Workshop titled “Comparing SIR IPC B-52 to Umpire 41 Functional & SIR Test Method.” This session will be held on July 24, 2025, and is open to professionals in electronics manufacturing, reliability engineering, and process development seeking insights into new testing standards for climatic reliability.
Defense Speak Interpreted: Is DARPA Still Around After CHIPS?
06/24/2025 | Dennis Fritz -- Column: Defense Speak InterpretedWhen I first published my Defense Speaks Interpreted column in January 2019 on the Defense Advanced Research Projects Agency (DARPA ERI), the agency advocated for an expanded Defense emphasis on closing the growing technology gap in microelectronics. The emphasis was on “resurgence.”
I-Connect007 Editor’s Choice: Five Must-Reads for the Week
06/13/2025 | Marcy LaRont, I-Connect007Today is Friday the 13th, and in much of Western folklore, this is a day when bad luck is lurking. But while Friday the 13th may top Western superstition charts, the global calendar is sprinkled with its own unlucky legends. In Spain and Greece, the bad juju lands on Tuesday the 13th—a day linked to Mars, the god of war, and naturally, chaos. In Italy, it’s Friday the 17th that is feared, thanks to the Roman numeral XVII, which can be rearranged to spell VIXI—Latin for “I have lived” (a poetic way of saying you’re dead).
TTCI Celebrates Melanie Rutkauskas’ 10-Year Anniversary and Her Leadership of New Training Division
06/12/2025 | TTCIThe Test Connection Inc. (TTCI), a leading provider of electronic test and manufacturing solutions, is proud to celebrate Melanie Rutkauskas on her 10-year anniversary with the company.
Bridging the Knowledge Gap in Test: A Conversation with Bert Horner
06/11/2025 | Barry Matties, I-Connect007Bert Horner is a seasoned industry veteran and co-creator of The Test Connection, Inc. (TTCI), a test and inspection company spanning over 45 years. In this candid conversation, Bert reflects on the challenges our industry faces with the retirement of career professionals and the subsequent loss of critical tribal knowledge. As he unveils The Training Connection’s innovative training initiatives, Bert emphasizes the importance of evolving educational programs that align with industry needs, particularly in design for test (DFT), and sheds light on strategies being implemented to foster the next generation of engineers.