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Gen3 to Showcase Cutting-Edge Test Solutions at Productronica India 2023
August 30, 2023 | Gen3Estimated reading time: 2 minutes
Gen3, Global leader in SIR, CAF, Solderability, Ionic Contamination & process optimisation equipment, announced its participation at productronica India, the International Trade Fair for Electronics Development and Production, taking place from Sept. 13-15, 2023, at the Bangalore International Exhibition Centre (BIEC) in Bengaluru, India on booth number PE 51 in Hall 4.
At the event, Gen3 will showcase its groundbreaking CM+ Series, representing the latest advancements in the testing and inspection industry.
Visitors can experience the 6 Sigma verified CM+ Series, the world's first combined ROSE (Resistivity of Solvent Extract) and Process Ionic Contamination Tester (PICT). A recipient of global awards, this industry-leading system measures ionic contamination in accordance with all existing test methods, including ROSE and PICT. Available in five different models and tank sizes, the CM+ Series offers versatility for various circuit assembly testing needs. Gen3 will be providing an inside tutorial on ionic contamination, offering attendees a unique opportunity to understand the CM+ Series’ capabilities. They will be able to see Gen3’s CM+ Series in action, showcasing how the system can operate for you and PCB boards.
Andrew Naisbitt, CEO of Gen3 who will attend the upcoming show, commented, “Productronica India 2023 is shaping up to be an exciting and pivotal event that holds the potential to reshape electronics manufacturing in India. There is an extensive lineup of seminars, workshops, and keynote speeches. I, for one, am looking forward to meeting Prime PCI’s customers, our Distributor for the Indian market, and catching up with fellow colleagues in the industry.”
Gen3’s commitment to providing comprehensive testing solutions is evident through its newly launched Objective Evidence website. This platform details the requirements from the latest J STD 001 Rev H, which can be efficiently met through the combination of AutoSIR and PICT testing. The AutoSIR performs the initial qualification, while the PICT test demonstrates ongoing conformity to the primary setup using the SIR technique.
Visitors are encouraged to visit Gen3's stand to explore the AutoSIR2+™ and CM+ Series demonstrations and gain insights into the revolutionary testing technologies.
For more information about Objective Evidence, visit www.objectiveevidence.org. For more information about Gen3 and its innovative testing solutions, visit www.gen3systems.com.
Additional content from Gen3:
- The Printed Circuit Assembler’s Guide to… Process Control by Graham K. Naisbitt, Dr. Chris Hunt
- The Printed Circuit Assembler’s Guide to… Process Validation by Graham K. Naisbitt
- I-007e Micro Webinar Series: “Predicting Reliability in Electronics”
- Roundtable Discussion: Process Ionic Contamination Test (PCT) Standard Roundtable with Industry Experts
You can view other titles in the I-007eBooks library here.
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