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OKI Develops 124-Layer PCB Technology for Next-Generation AI Semiconductor Testing Equipment

04/28/2025 | BUSINESS WIRE
OKI Circuit Technology, the OKI Group printed circuit board (PCB) company, has successfully developed 124-layer PCB technology for wafer inspection equipment designed for next-generation high bandwidth memory, such as HBM mounted on AI semiconductors.

Real Time with... IPC APEX EXPO 2025: TRI Innovation—Transforming Semiconductor Inspection with AI Technology

04/25/2025 | Real Time with...IPC APEX EXPO
Nolan Johnson talks with David Chiu, USA Sales Manager for TRI Innovation. TRI uses advanced technology to tackle challenges in inspecting tiny components. Their AI programming reduces coding time by 75%, enhancing efficiency in inspections. Collaborating with Nvidia, TRI integrates GPU technology to improve product development and encourages customers to share data for better AI performance.

TRI at SMTA Wisconsin Expo 2025

04/24/2025 | TRI
Test Research, Inc. (TRI), the leading test and inspection systems provider for the electronics manufacturing industry, will join the SMTA Wisconsin Expo 2025.

Koh Young Installs 24,000th Inspection System at Fabrinet Chonburi

04/23/2025 | Koh Young
Koh Young, the global leader in True 3D measurement-based inspection and metrology solutions, proudly announces the installation of its 24,000th inspection system at Fabrinet Chonburi in Thailand. This advanced facility is operated by Fabrinet Co., Ltd., a global provider of advanced manufacturing services, specializing in complex optical, electro-optical, and electronic products

The Future of Advanced Packaging Inspection Is X-ray

04/22/2025 | David Kruidhof and Kevin Jan, Comet Yxlon
Driven by smartphones, high-performance computers, and artificial intelligence, the global demand for high-end computing power is constantly rising. The industry is also facing demands for miniaturization, which creates the need for ever-smaller defect recognition. The semiconductor industry has been identifying and solving these challenges for decades using various optical inspection and SEM tools.
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