Indium Technical Expert to Present at SiP Conference China
November 25, 2024 | Indium CorporationEstimated reading time: 1 minute
Indium Corporation Senior Area Technical Manager for East China Leo Hu is scheduled to deliver a presentation on Low-Temperature Solder Material in Semiconductor Packaging Applications at SiP China Conference 2024 on November 27 in Suzhou, China.
The presentation, titled Low-Temperature Material Discovery and Readiness for First-Level Interconnect in Semiconductor Packaging, will explore the latest advancements in low-temperature alloys designed for solder bump or Cu pillar first-level interconnects.
In recent years, more low-temperature alloys and materials—operating below the standard SAC305 processing temperature—have been introduced in printed circuit board assembly. Reducing warpages and energy consumption and creating a processing temperature hierarchy for multiple assembly processes are some of the key drivers for the shift to the use of low-temperature material. There has been a rapid increase in the use of similar alloys or material for first-level interconnect in semiconductor packaging, mainly in the form of solder bump or Cu pillar interconnect.
“In this presentation, we will discuss current available alloys or material that can be suitable candidates for first-level interconnect. We also conducted a survey to understand the challenges, readiness, and need of the industry for using low-temperature material focusing on first-level interconnect,” said Hu. “I’m excited to share our collective expertise with my colleagues as we explore homogeneous or partial mixing of low-temperature solder or mid-temperature solder with current standard Pb-free alloy, which can be critical to the thermal fatigue behavior and reliability of the interconnect.”
As Senior Area Technical Manager for East China, Hu manages the technical support team in East China and collaborates with global technical support teams to provide Indium Corporation customers with product and application solutions. He has more than 19 years of experience in semiconductor packaging and possesses expertise in advanced assembly technology development, process improvement, and assembly materials applications. Hu earned a master’s degree in IC engineering from the Chinese Academy of Science and a bachelor’s degree in electronic information science and technology from Nankai University, Tianjin, China.
Suggested Items
DELO Introduces UV-approach for Fan-out Wafer-level Packaging
10/25/2024 | DELODELO has developed a new approach for fan-out wafer-level packaging (FOWLP). Its feasibility study shows: With the use of UV-curable molding materials instead of heat curing ones, warpage and die shift can be reduced significantly. Additionally, this leads to improvements in curing time and minimizes the energy consumption.
Book Excerpt: The Printed Circuit Assembler’s Guide to... Low-Temperature Soldering, Vol. 2, Chapter 4
10/03/2024 |Chapter 4 of this book addresses the challenges in ensuring high electrical reliability of low-temperature solder pastes in modern electronic assembly. Also covered is the need for new-generation materials due to advancements in technology. The authors also explore the impact of flux components on electrical reliability and the formulation considerations to achieve higher reliability.
Indium to Showcase Industry-Leading Solder Paste and Alloy Technology at Detroit Battery Show
10/01/2024 | Indium CorporationAs one of the leading materials providers to the electronics assembly industry, Indium Corporation® is proud to feature its industry-leading Durafuse® solder technology at the Battery Show North America, October 7-10, in Detroit, Michigan.
Book Excerpt: The Printed Circuit Designer’s Guide to... Thermal Management with Insulated Metal Substrates, Vol. 2, Chapter 4
09/25/2024 | I-Connect007 Editorial TeamDirect-bonded copper (DBC) with a ceramic base is a commonly used assembly technology. While advantages include excellent solder crack compensation due to similar CTE values between component and substrate, the construction is fragile and therefore places limits on size and exposure to vibration. Small assemblies in basic shapes such as a rectangle can be done, although larger, more complex shapes become difficult.
Some Fundamentals of Tin-Bismuth Metallurgy and Electromigration
09/24/2024 | Prabjit Singh, Raiyo Aspandiar, Haley Fu, and L. A. SwaminathanNear-eutectic tin-bismuth alloy is a strong contender as the solder of choice for low-temperature electronic assembly applications. This article will describe the recent significant developments by the iNEMI project team on the understanding of the electromigration behavior of Sn-Bi solder which has a unique physical metallurgy and electromigration behavior quite different for that of Sn-Ag-Cu (SAC) solder and other solders in common use today.