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Keysight Technologies Co-Sponsors Characterization Seminar
September 9, 2015 | Keysight TechnologiesEstimated reading time: 1 minute
Keysight is co-sponsoring a free seminar with Maury Microwave to explore various interconnected topics of device characterization that form the amplifier design flow, from component to circuit to system measurement and modeling. Additional topics include pulsed IV and S-parameters for compact model extraction, load pull for model validation and measurement, amplifier design and IC stability analysis, X-parameter modeling and system-level simulations.
During the Amplifier Design Flow—From Component to Circuit to System Measurement & Modeling seminar, instructors from Keysight and Maury Microwave will provide technical instruction and measurement demonstrations. Attendees will also have the opportunity to interact with experienced applications engineers.
When
Wednesday, Sept. 23 and Wednesday, Sept. 30
Where
Sept. 23 Event: Linthicum, MD, Hilton Baltimore BWI Airport, 1739 West Nursery Road, Linthicum, MD
Sept. 30 Event: Greensboro, NC, Greensboro-High Point Marriott Airport, 1 Marriott Drive, Greensboro, NC
For more information, visit www.keysight.com/find/events
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