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Last Call to Register for 2016 Environmental Compliance Conference
June 1, 2016 | IPCEstimated reading time: 1 minute
It's a continuing challenge to stay current on global environmental regulations and issues such as EU RoHS exemption requests, China RoHS, EU REACH and the EU Circular Economy Strategy.
That is why IPC and ITI are again joining forces to help keep you ahead of the curve with the 2016 Conference on Emerging & Critical Environmental Product Regulations. This year's conference is your opportunity to hear expert insights on the recent EU Court of Justice decision on the definition of "article" and its impact on EU REACH, new developments for the EU RoHS exemption requests, and the recast and use changes to China RoHS.
The conference will feature compelling keynote presentations from well-known United Kingdom (UK) regulators Steve Andrews, of the UK Department for Environment, Food & Rural Affairs; and Dave Symons, of the Department for Business, Innovation & Skills and the Department for Energy and Climate Change.
An expert panel of electronic supply chain members and professionals will also discuss alternatives assessment — including the positive or negative impacts of substituting materials in products — and how to manage materials deselection based on assessments. Panelists include, by location:
- Boston: Pam Eliason, TURI; Martha Coopersmith Gray, Ampehnol TCS; Stephen Greene, EMC Corporation
- Chicago: Dr. John Howarter, Purdue University; Haim Eliyahu, Molex Inc.; Bill Olson, Seagate Technology
- Silicon Valley: Corrine Holmes, Microsoft Corporation; John Katz, EPA Region 9; Neil Smith, Isola Group SARL
This conference will provide anyone who is responsible for keeping their organization in compliance with environmental regulations the tools they need to comply with legal, regulatory, and customer requirements.
For more information, click here.
Suggested Items
New IPC White Paper Focuses on Use of Artificial Intelligence in Automated Optical Inspection in Electronics Manufacturing
02/06/2025 | IPCA new white paper, “Unlocking AI for Automated Optical Inspection” released today by IPC’s Chief Technologist Council, focuses on AI’s role in AOI processes for printed circuit board assemblies (PCBAs). According to data within the white paper, recent advancements in technology, particularly in Cloud AI, IoT and Smart Manufacturing, have provided opportunities to further enhance AOI performance.
First Pan-European Electronics Design Conference (PEDC) in Vienna Inspires Participants from 20 Countries
02/06/2025 | IPCThe first Pan-European Electronics Design Conference (PEDC) in Vienna was a great success The new international conference, organized by Fachverband Elektronikdesign und -fertigung e. V. (FED) and IPC, brought together experts and industry representatives from 20 countries and four continents.
Delvitech to Officially Present Hybrid AOI + SPI Horus System at IPC APEX EXPO 2025
02/06/2025 | DelvitechDelvitech is happy to announce that it will showcase its groundbreaking Horus system, the industry's first all-in-one AI native platform for both Automatic Optical Inspection (AOI) and Solder Paste Inspection (SPI), at the upcoming IPC APEX EXPO 2025. The event is scheduled from March 18 to 20, 2025, at the Anaheim Convention Center in Anaheim, California.
The Test Connection, Inc. to Showcase Advanced Testing Solutions at SMTA Austin Expo & Tech Forum
02/04/2025 | The Test Connection Inc.The Test Connection Inc. (TTCI), a leading provider of electronic test and manufacturing solutions, is excited to announce its participation in the SMTA Austin Expo & Tech Forum on February 6, 2025 in Austin, Texas.
Nolan's Notes: Find the Help You Need—Accessing Technical Resources
02/04/2025 | Nolan Johnson -- Column: Nolan's NotesSome close friends of mine have a card catalog in their family room—with the cards still in it. It’s just a novelty now, but it wasn’t that long ago that the card catalog was the end-all, be-all of research resources. As a college student, I remember something like two dozen or more of the very large card catalog cabinets in the Oregon State University Library. It’s not lost on me that my friend’s card catalog “liberated” from the university is a snapshot of that particular knowledge base at that particular moment in time. Today’s access to a library’s contents have changed dramatically.