Powering the Future: When Material Choice Defines RF Performance
Learning with Leo: The Cost of Cleaning and Protecting the Ozone Layer
Nolan’s Notes: Cleaning With Smaller Geometries
iNEMI Tech Topic Series: Counterfeit Components, Emerging Trends in Counterfeit Detection and Mitigation, will be held Thursday, December 7, 2023 / 11:00 a.m.—12:30 p.m. EST (US).
The third session in iNEMI’s Counterfeit Components series will look at emerging technologies for detection and mitigation. We will also look at what is ahead for hardware security and review results of an industry survey regarding experiences with counterfeit components and strategies used to mitigate risk.
Topics and Speakers
Use of LIBS (laser-induced breakdown spectroscopy), an analytical technique, to detect and characterize materials — Terry Munson (Foresite)
Understanding counterfeit electronics detection and mitigation — Navid Asadi Zanjani (University of Florida)
What’s next? Roadmapping smart manufacturing solutions for component/material assurance — Francis Mullany, PhD (iNEMI)
Results of iNEMI survey regarding industry experiences with counterfeit components and strategies used to mitigate risk — Jennifer Muncy (IBM), Paul Hale (NIST), Terry Munson (Foresite), Ben German (Intel) and Mark Schaffer (iNEMI).
If you are interested in this topic but unable to attend, please register and we will send you a link to the presentation and webinar recording following the event. For additional information about speakers and agenda.
Registration
This webinar is free and open to industry; advance registration is required.
Thursday, December 7, 2023
11:00 a.m. — 12:30 p.m. EST (US)
5:00-6:30 p.m. CET (Europe)
