Share on:

Share on LinkedIn Share on X Share on Facebook Share with email

Testimonial

"The I-Connect007 team is outstanding—kind, responsive, and a true marketing partner. Their design team created fresh, eye-catching ads, and their editorial support polished our content to let our brand shine. Thank you all! "

Sweeney Ng - CEE PCB

Suggested Items

Würth Elektronik Expands Laboratory in Shenzhen, China

04/16/2026 | Wurth Elektronik
Würth Elektronik eiSos Group celebrated the official opening of the Laboratory Phase II at its Asia Quality Design Center (QDC Asia) in Shenzhen on March 5, 2026.

RTX's Raytheon Completes First Flight Test for RAIVEN® Sensing System

04/15/2026 | RTX
Raytheon, an RTX business, has successfully completed the first flight test of its RAIVEN® Staring system, an air-cooled sensor suite that delivers greater situational awareness and operator survivability, on a UH-60 Black Hawk helicopter.

Synopsys Solutions Support NASA's Artemis Program with Spacesuit Analysis and Communication System Development

04/14/2026 | PRNewswire
NASA selected Synopsys, Inc. and EMA to verify spacesuit compatibility with the lunar environment.

Fuse Expands U.S. Radiation Testing Capacity with New Albuquerque Facility

04/13/2026 | PRNewswire
Fuse, a leading U.S.-based fusion company, announced the establishment of a new state-of-the-art facility in Albuquerque, New Mexico that will expand U.S. radiation effects testing capacity for critical defense, space, and semiconductor technologies.

Express Manufacturing, Inc. Enhances Test Capabilities with TAKAYA APT-1600FD-SL Investment

04/07/2026 | Express Manufacturing, Inc.
Express Manufacturing, Inc. (EMI), a global electronics manufacturing services (EMS) provider, has strengthened its test capabilities with the recent purchase of the TAKAYA APT-1600FD-SL dual-sided flying probe test system, expanding its ability to support increasingly complex and high-reliability PCB assemblies.
Copyright © I-Connect007 | IPC Publishing Group Inc. All rights reserved. Log in