New Microwave Imaging Approach Opens a Nanoscale View on Processes in Liquids
March 29, 2016 | NISTEstimated reading time: 3 minutes
U.S. government nanotechnology researchers have demonstrated a new window to view what are now mostly clandestine operations occurring in soggy, inhospitable realms of the nanoworld—technologically and medically important processes that occur at boundaries between liquids and solids, such as in batteries or along cell membranes.
NIST and ORNL scientists have devised a near-field microwave imaging approach to capture images of nanoscale processes under natural conditions. As the tip of an atomic force microscope scans over an ultrathin membrane it emits near-field microwaves into the sample below. Shown are images of yeast cells and silver dendrites that formed on an electrode during electroplating.
The new microwave imaging approach trumps X-ray and electron-based methods that can damage delicate samples and muddy results. And it spares expensive equipment from being exposed to liquids, while eliminating the need to harden probes against corrosive, toxic, or other harmful environments.
Writing in the journal ACS Nano, the collaborators—from the Center for Nanoscale Science and Technology at the National Institute of Standards and Technology (NIST) and the Department of Energy’s Oak Ridge National Laboratory (ORNL)—describe their new approach to imaging reactive and biological samples at nanoscale levels under realistic conditions.
The key element is a window, an ultrathin membrane that separates the needle-like probe of an atomic force microscope (AFM) from the underlying sample, held in tiny containers that maintain a consistent liquid or gas environment. The addition transforms near-field microwave imaging into a versatile tool, extending its use beyond semiconductor technology, where it is used to study solid structures, to a new realm of liquids and gases.
“The ultrathin, microwave-transparent membrane allows the sample to be examined in much the same way that Earth’s radar was used to reveal images of the surface of Venus through its opaque atmosphere,” explained NIST physicist Andrei Kolmakov.
“We generate microwaves at the apex—or very end—of the probe tip,” Kolmakov said. “The microwaves penetrate through the membrane a few hundred nanometers deep into the liquid up to the object of interest. As the tip scans the sample from across the membrane, we record the reflected microwaves to generate the image.”
Microwaves are much larger than the nanoscale objects they are used to “seeing.” But when emitted from only a minuscule distance away, near-field microwaves reflected from a sample yield a surprisingly detailed image.
Page 1 of 2
Suggested Items
I-Connect007’s Editor’s Choice: Five Must-Reads for the Week
07/04/2025 | Marcy LaRont, I-Connect007For our industry, we have seen several bullish market announcements over the past few weeks, including one this week by IDC on the massive growth in the global server market. We’re also closely watching global trade and nearshoring. One good example of successful nearshoring is Rehm Thermal Systems, which celebrates its 10th anniversary in Mexico and the official opening of its new building in Guadalajara.
Driving Innovation: Direct Imaging vs. Conventional Exposure
07/01/2025 | Simon Khesin -- Column: Driving InnovationMy first camera used Kodak film. I even experimented with developing photos in the bathroom, though I usually dropped the film off at a Kodak center and received the prints two weeks later, only to discover that some images were out of focus or poorly framed. Today, every smartphone contains a high-quality camera capable of producing stunning images instantly.
United Electronics Corporation Advances Manufacturing Capabilities with Schmoll MDI-ST Imaging Equipment
06/24/2025 | United Electronics CorporationUnited Electronics Corporation has successfully installed the advanced Schmoll MDI-ST (XL) imaging equipment at their advanced printed circuit board facility. This significant technology investment represents a continued commitment to delivering superior products and maintaining their position as an industry leader in precision PCB manufacturing.
Orbel Corporation Integrates Schmoll Direct Imaging
06/04/2025 | Schmoll AmericaOrbel Corporation in Easton, PA, proudly becomes the first PCM facility in the U.S. equipped with Schmoll’s MDI Direct Imaging system. This installation empowers Orbel to support customers with greater precision and quality.
Key Insights on Photoresist for Defect Reduction
05/21/2025 | I-Connect007 Editorial TeamIn PCB manufacturing, understanding the intricacies of the photoresist process is crucial for achieving high-quality results. Industry experts Josh Krick, a technical service engineer at IEC, and Tim Blair, a PCB imaging specialist at Tim Blair LLC, share their knowledge on the essential stages of photoresist application, highlight critical advancements in materials, and discuss common defects encountered during production. They share best practices and innovative solutions to enhance the manufacturing process, reduce defects, and ensure efficiency and reliability in high-tech applications.