Share on:

Share on LinkedIn Share on X Share on Facebook Share with email

Suggested Items

LG Display’s Guangzhou LCD Plant Officially Transferred to CSOT, Boosting Its Share of Large-Generation LCD Capacity to 22.9%

04/01/2025 | TrendForce
LG Display’s Guangzhou Gen 8.5 LCD line was officially transferred to CSOT today (April 1st) and renamed “T11”.

Real Time with... IPC APEX EXPO 2025: LPKF's Advancements in Laser Depaneling Technology

03/25/2025 | Real Time with...IPC APEX EXPO
In this recent interview, Jake Benz from LPKF Laser and Electronics discusses advancements in laser depaneling technology, focusing on speed and quality. He highlights the previous negative reputation of laser depaneling and shares insights from nearly two decades of experience. As customer needs evolve, traditional companies are exploring laser technology.

Calling All Designers: The Latest Design Technology and AI  

03/20/2025 | Andy Shaughnessy, Design007 Magazine
Advanced design technology and AI were in the spotlight at the annual Design Town Hall, held March 19 during IPC APEX EXPO 2025. Speakers included IPC’s Peter Tranitz, Matt Kelly, Devan Iyer, as well as a panel on the use of AI in PCB design moderated by Susan Kayesar of Siemens.

DARPA Seeks Innovators to Create Revolutionary Tech for National Security

03/17/2025 | DARPA
DARPA’s Defense Sciences Office (DSO) is hosting Discover DSO Day (D3) in Chicago, April 23-24. The objective of the event is to connect DSO with the science and technology community in the Midwest to help generate world-leading technologies and capabilities for U.S. national security, which is critical to the Office’s mission of creating and preventing scientific surprise.

INEMI Launches Study of AOI Inspection for Fine Pitch Substrates Seeking Industry Participation

03/11/2025 | iNEMI
The fine lines and spaces of increasingly popular heterogeneous SiP packages, coupled with larger panel sizes and more substrate layers, demand increased capabilities from automated optical inspection (AOI) equipment to accurately detect, characterize and reject true defects without over-rejections.
Copyright © 2025 I-Connect007 | IPC Publishing Group Inc. All rights reserved. Log in