Elementary, Mr. Watson: Controlled Impedance—When ‘Connecting the Dots’ Stops Working
Beyond Design: How Signals Survive the Hostile PCB Environment
Connect the Dots: What Designers Should Know About Non-conductive Via Fill
The third session in iNEMI’s Counterfeit Components series which will be hold Thursday, December 7, 2023 / 11:00 a.m.—12:30 p.m. EST (US), will look at emerging technologies for detection and mitigation. We will also look at what is ahead for hardware security and review results of an industry survey regarding experiences with counterfeit components and strategies used to mitigate risk.
Topics and Speakers
- Use of LIBS (laser-induced breakdown spectroscopy), an analytical technique, to detect and characterize materials — Terry Munson (Foresite)
- Understanding counterfeit electronics detection and mitigation — Navid Asadi Zanjani (University of Florida)
- What’s next? Roadmapping smart manufacturing solutions for component/material assurance — Francis Mullany, PhD (iNEMI)
- Results of iNEMI survey regarding industry experiences with counterfeit components and strategies used to mitigate risk — Jennifer Muncy (IBM), Paul Hale (NIST), Terry Munson (Foresite), Ben German (Intel) and Mark Schaffer (iNEMI).
If you are interested in this topic but unable to attend, please register and we will send you a link to the presentation and webinar recording following the event. For additional information about speakers and agenda.
Registration
This webinar is free and open to industry; advance registration is required, check iNEMI's website.
Thursday, December 7, 2023
11:00 a.m. — 12:30 p.m. EST (US)
5:00-6:30 p.m. CET (Europe)
