-
-
News
News Highlights
- Books
Featured Books
- design007 Magazine
Latest Issues
Current IssuePower Integrity
Current power demands are increasing, especially with AI, 5G, and EV chips. This month, our experts share “watt’s up” with power integrity, from planning and layout through measurement and manufacturing.
Signal Integrity
If you don’t have signal integrity problems now, you will eventually. This month, our expert contributors share a variety of SI techniques that can help designers avoid ground bounce, crosstalk, parasitic issues, and much more.
Proper Floor Planning
Floor planning decisions can make or break performance, manufacturability, and timelines. This month’s contributors weigh in with their best practices for proper floor planning and specific strategies to get it right.
- Articles
- Columns
- Links
- Media kit
||| MENU - design007 Magazine
Koh Young to Showcase Semiconductor Metrology and Advanced Packaging Inspection Solutions at iMAPS 2025 in San Diego
September 25, 2025 | Koh Young TechnologyEstimated reading time: 1 minute

Koh Young Technology, the global leader in True 3D measurement-based metrology and inspection solutions, will make its first appearance at iMAPS 2025, the premier event for microelectronics and advanced packaging, taking place September 29 through October 2, 2025 in San Diego. The participation underscores Koh Young’s growing commitment to the advanced packaging and semiconductor industry. At booth 805, Koh Young experts will be available to discuss the proven Meister Series and the ZenStar platform, both designed to address the evolving challenges of next-generation semiconductor packaging.
The Meister Series has established itself as a benchmark for high-resolution inspection of System-in-Package (SiP), Advanced Package, and 3D semiconductor devices. Delivering high resolution, precision optics, and AI-driven analysis, the Meister Series provides accurate measurement of critical dimensions, bumps, pillars, and other essential structures. Its versatility makes it equally valuable in R&D environments and high-volume production lines where yield and reliability are critical.
Addressing, wafer-level metrology, the ZenStar builds on Koh Young’s True 3D measurement foundation to deliver the speed, accuracy, and scalability required for the applications. As advanced device architectures push the limits of conventional metrology, The ZenStar provides semiconductor and packaging engineers with the performance and confidence needed to maintain process stability and accelerate time-to-market.
“Our first appearance at iMAPS reflects Koh Young’s focus on advanced packaging and semiconductors,” said Allen Phung, Head of Sales for the Americas at Koh Young America. “By combining the proven performance of the Meister with the scalability of the ZenStar, we’re helping manufacturers achieve higher yield, greater reliability, and faster time-to-market for next-generation devices.”
Koh Young will be available in booth 805 throughout the event to share insights, discuss application challenges, and highlight how its solutions are shaping the future of semiconductor packaging.
Testimonial
"The I-Connect007 team is outstanding—kind, responsive, and a true marketing partner. Their design team created fresh, eye-catching ads, and their editorial support polished our content to let our brand shine. Thank you all! "
Sweeney Ng - CEE PCBSuggested Items
Koh Young Discussing Ways to Apply Smart Factory Insights to Maximizing Productivity at SMTA Tijuana
10/14/2025 | Koh YoungKoh Young, the industry leader in True 3D measurement-based inspection solutions, will present at the SMTA Tijuana Expo & Tech Forum on November 13, 2025, at the Quartz Hotel in Tijuana, Baja California.
Koh Young, Fuji, and Kurtz ERSA Drive Smart Manufacturing Solutions for EV and Automotive Electronics at Kunshan, China Technical Seminar
09/25/2025 | Koh YoungKoh Young Technology, the global leader in True 3D measurement-based inspection solutions, partnered with Fuji Corporation and Kurtz ERSA to host an exclusive technical seminar for leading automotive manufacturers in East China.
Koh Young, Fuji, and Kurtz ERSA Drive Smart Manufacturing Solutions for EV and Automotive Electronics at Kunshan, China Technical Seminar
09/11/2025 | Koh YoungKoh Young Technology, the global leader in True 3D measurement-based inspection solutions, partnered with Fuji Corporation and Kurtz ERSA to host an exclusive technical seminar for leading automotive manufacturers in East China. Held on September 4 at Fuji’s factory in Kunshan, the event gathered participants representing over 35 companies.
Koh Young Showcases Advanced Dimensional Metrology and Inspection Solutions for Semiconductor and Wafer-Level Packaging at SEMICON West
09/03/2025 | Koh YoungKoh Young Technology, the industry leader in True 3D™ measurement-based dimensional metrology and inspection solutions, will present its latest advancements for semiconductor and advanced packaging applications at SEMICON West 2025 in Booth 5949.
Koh Young Highlights the Market Driven Nova Series and Smart Factory Solutions at Productronica India 2025
09/02/2025 | Koh YoungKoh Young, the global leader in True 3D measurement‑based inspection and smart factory platforms, is poised to highlight its cutting‑edge technologies at Productronica India 2025, running from September 17–19 at the Bangalore International Exhibition Centre (BIEC).